GB/T 43894.2-2026
半导体晶片近边缘几何形态评价 第2部分:边缘卷曲法(ROA)
Practice for determining semiconductor wafer near-edge geometry—Part 2: Roll-off amount(ROA)
- 实施日期
- 2026-08-01
- ICS 分类
- 77.040
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
找到 5,061 条
GB/T 43894.2-2026
Practice for determining semiconductor wafer near-edge geometry—Part 2: Roll-off amount(ROA)
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