GB/T 12703.5-2010
纺织品 静电性能的评定 第5部分:摩擦带电电压
Textile - Evaluation for electrostatic properties - Part 5: Frictional voltage
- 实施日期
- 2011-06-01
- ICS 分类
- 59.080.01
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
找到 70,494 条
GB/T 12703.5-2010
Textile - Evaluation for electrostatic properties - Part 5: Frictional voltage
GB/T 12703.4-2010
Textile - Evaluation for electrostatic properties - Part 4: Resistivity
GB/T 26085-2010
Test method and determination of total tin in antifouling paints for ship
GB/T 25505-2010
General provisions for programming mooring, sea trials and fishing of sea going fishery vessel
GB/T 6730.69-2010
Iron ores - Determination of fluoride and chloride content - Ion chromatography
GB/T 5121.28-2010
Method for chemical analysis of copper and copper alloys - Part 28:Determination of Chromium,Iron,Manganese,Cobalt,Nickel,Zinc,Arsenic, Selenium,Silver,Cadmium,Tin,Antimony,Tellurium,Lead and Bismuth content - Inductively coupled plasma-mass spectrum method
GB/T 3884.12-2010
Methods for chemical analysis of copper concentrates - Part 12:Determination of fluoride content and chloride content - Ion chromatography
GB/T 3310-2010
Ultrasonic testing method of copper and copper alloy bars
GB/T 26117-2010
Testing method of micro electricpump
GB/T 26116-2010
Internal combustion engine coaxial pump test method
GB/T 26109-2010
Test of aqueous protective fluids for rust preventing ability - Electrochemical measurement with wire beam electrode
GB/T 26105-2010
Test of rust preventive oil for rust preventing ability -Electrochemical measurement with wire beam electrode
GB/T 26078-2010
Metallic materials - Welding residual stresses - Method with explosion treatment
GB/T 26076-2010
Metal sheets and strips - Axial-force-controlled fatigue testing method
GB/T 26074-2010
Germanium monocrystal-measurement of resistivity-DC linear four-point probe
GB/T 26070-2010
Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method
GB/T 26068-2010
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
GB/T 26067-2010
Standard test method for dimensions of notches on silicon wafers
GB/T 26066-2010
practice for shallow etch pit detection on silicon
GB/T 26019-2010
Methods for chemical analysis of high impurity tungsten mineral - Determination of tungsten trioxide content - Twice separation and igniting gravimetric method