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GB/T 7717.16-2009
Acrylonitrile for industrial use - Part 16: Determination of content of iron - Graphite furnace atomic absorption spectrometer method
GB/T 6624-2009
Standard method for measuring the surface quality of polished silicon slices by visual inspection
GB/T 6621-2009
Testing methods for surface flatness of silicon slices
GB/T 6618-2009
Test method for thickness and total thickness variation of silicon slices
GB/T 6617-2009
Test method for measuring resistivity of silicon wafer using spreading resistance probe
GB/T 6150.9-2009
Methods for chemical analysis of tungsten concentrates - Determination of copper content - Flame atomic absorption spectrometry
GB/T 6150.8-2009
Methods for chemical analysis of tungsten concentrates - Determination of molybdenum content - The thiocyanate spectrophotometry
GB/T 6150.3-2009
Methods for chemical analysis of tungsten concentrates - Determination of phosphorus content - The phosphorus molybdenum yellow spectrophotometry
GB/T 6150.16-2009
Methods for chemical analysis of tungsten concentrates - Determination of iron content - The sulfosalicylic acid spectrophotometry
GB/T 4061-2009
Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion
GB/T 4058-2009
Test method for detection of oxidation induced defects in polished silicon wafers
GB/T 24582-2009
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
GB/T 24490-2009
Test method for purity of multi-walled carbon nanotubes
GB/T 1555-2009
Testing methods for determining the orientation of a semiconductor single crystal
GB/T 1554-2009
Testing method for crystallographic perfection of silicon by preferential etch techniques
GB/T 1553-2009
Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
GB/T 14146-2009
Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
GB/T 14141-2009
Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
GB/T 14140-2009
Test method for measuring diameter of semiconductor wafer
GB/T 24554-2009
Performance test methods for fuel cell engines