GB/T 10185-2012
电子设备用固定电容器 第7部分:分规范 金属箔式聚苯乙烯膜介质直流固定电容器
Fixed capacitors for use in electric equipment - Part 7: Sectional specification Fixed polystyrene film dielectric metal foil d.c. capacitors
- 实施日期
- 2013-02-15
- ICS 分类
- 31.060.30
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
找到 1,403 条
GB/T 10185-2012
Fixed capacitors for use in electric equipment - Part 7: Sectional specification Fixed polystyrene film dielectric metal foil d.c. capacitors
GB/T 7333-2012
Fixed capacitors for use in electronic equipment - Part 2-1: Blank detail specification - Fixed metallized polyethylene-terephthalate film dielectric d.c.capacitors - Assessment levels E and EZ
GB/T 5969-2012
Fixed capacitors for use in electronic equipment - Part 9-1: Blank detail specification:Fixed capacitor of ceramic dielectric,Class 2 - Assessment level EZ
GB/T 3352-2012
Synthetic quartz crystal - Specifications and guide to the use
GB/T 17207-2012
Fixed capacitors for use in electronic equipment - Part 18-1: Blank detail specification - Fixed aluminium electrolytic surface mount - Capacitors with solid(MnO2) electrolyte - Assessment level EZ
GB/T 12859.2-2012
Piezoelectric ceramic resonators - A specification in the IEC quality assessment System for electronic components (IECQ) - Part 2: Sectional specification-Qualification approval
GB/T 12859.201-2012
Piezoelectric ceramic resonators - A specification in the quality assessment System for electronic components - Part 2-1: Blank detail specification-Assessment level E
GB/T 12859.1-2012
Piezoelectric ceramic resonators - A specification in the IEC quality assessment System for electronic components(IECQ) - Part 1: Generic specification-Qualification approval
GB/T 10190-2012
Fixed capacitors for use in electronic equipment - Part 16: Sectional specification:Fixed metallized polypropylene film dielectric d.c.capacitors
GB/T 4937.3-2012
Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination
GB/T 4937.4-2012
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
GB/T 9532-2012
Designations for piezoelectric crystals
GB/T 28862-2012
Method for processing sample of encapsulating material of powdered epoxy
GB/T 28861-2012
Test method for measuring melt fluidity of encapsulating material of powdered epoxy
GB/T 28860-2012
Test method for the determination of get time of encapsulating material of powdered epoxy
GB/T 18910.61-2012
Liquid crystal display devices - Part 6-1: Measuring methods for liquid crystal display devices - Photoelectric parameter
GB/T 12079-2012
Measurements of the photoelectric properties for X-ray tubes
GB/T 4597-2012
Vocabulary of electronic tubes
GB/T 12274.1-2012
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
GB/T 12273.501-2012
Quartz crystal units A specification in the quality assessment system for electronic components Part 5.1: Blank detail specification- qualification approval