组合使用关键词、标准类型、状态与 ICS 分类，快速定位所需国家标准。
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GB/T 47752-2026
Micro-electromechanical systems (MEMS) technology—Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
GB/T 47768-2026
Micro-electromechanical systems (MEMS) technology—Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
GB/T 47749-2026
Micro-electromechanical system (MEMS) technology—Test method for coefficient of linear thermal expansion of micro-electromechanical solid-state material
GB/T 47753-2026
Micro-electro mechanical systems（MEMS）technology—Technical specification of automotive MEMS semiconductor gas sensor
GB/T 47909-2026
Diamond polycrystal wafers
GB/T 47837.4012-2026
Materials for printed circuit boards and other interconnecting structures—Part 4-12: Prepreg for multilayer printed circuit boards—Non-halogenated multifunctional epoxide woven E-glass prepreg
GB/T 47837.4017-2026
Materials for printed circuit boards and other interconnecting structures—Part 4-17: Prepreg for multilayer printed circuit boards—Non-halogenated epoxide woven E-glass prepreg for lead-free assembly
GB/T 47837.4016-2026
Materials for printed circuit boards and other interconnecting structures—Part 4-16: Prepreg for multilayer printed circuit boards—Non-halogenated multifunctional epoxide woven E-glass prepreg for lead-free assembly
GB/T 47667-2026
Bypass thyristors of converter valves for high-voltage direct current power transmission using voltage sourced converters
GB/T 47767-2026
Micro-electromechanical systems (MEMS) technology—Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
GB/T 47725-2026
Micro-electromechanical systems (MEMS) technology—Requirements for reliability evaluation of three-dimensional structure of through-silicon vias
GB/T 47719-2026
Micro-electromechanical systems (MEMS) technology—Test methods of the performances for MEMS capacitive microphone
GB/T 47598-2026
Acousto-optic crystals
GB/T 47601-2026
Electro-optic crystals
GB/T 42706.9-2026
Electronic components—Long-term storage of electronic semiconductor devices—Part 9：Special cases
GB/T 42709.3-2026
Semiconductor devices—Micro-electromechanical devices—Part 3: Thin film standard test piece for tensile testing
GB/T 42709.2-2026
Semiconductor devices—Micro-electromechanical devices—Part 2: Tensile testing method of thin film materials
GB/T 46567.2-2026
Intelligent computing—Test method for memristor—Part 2：Linearity
GB/T 47524-2026
Lasers and laser-related equipment—Test method for angle resolved scattering
GB/T 4023.3-2026
Discrete semiconductor devices—Part 3: Signal, switching and regulator diodes