组合使用关键词、标准类型、状态与 ICS 分类，快速定位所需国家标准。
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GB/T 11310-1989
Test methods for the properties of piezoelectric ceramics--Test methods for temperature characteristics of relative free dielectric constants
GB/T 11309-1989
Test methods for the properties of piezoelectric ceramics--Quasi-static testfor piezoelectric strain content d33
GB/T 11297.2-1989
Test method for side direction scatteringcoefficient of laser rods
GB/T 11296-1989
Designation for infrared detecting materials
GB/T 11295-1989
Designation for laser crystal rods
GB/T 11293-1989
Terms and definitions of solid-state laser materials
GB/T 11320-1989
Test methods for the properties of piezoelectric ceramics--Material with the low mechanical quality factor
GB/T 3430-1989
The rule of type designation for semiconductor integrated circuits
GB/T 11498-1989
Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
GB/T 11480-1989
Methods of measurement for camera tubes
GB/T 11478-1989
Generic specification for camera tubes
GB/T 11300-1989
Blank detail specification for variable tuning capacitors type A in electronic equipments
GB/T 11479-1989
Blank detail specification for camera tubes
GB/T 11149-1989
Standard capacitance boxes
GB/T 11301-1989
Blankdetail specification for variable tuning capacitors type A fitted with integralpreset capacitors type C in electronic equipments
GB/T 11497.2-1989
Series and products for CMOS semiconductor integrated circuits--Products of series 54/74 HCT
GB/T 3432.4-1989
Series and productsfor TTL semiconductor integrated circuits--Products of series 54/74 LS
GB/T 11490-1989
Dimensions of base for colour picture tube
GB/T 11497.1-1989
Series and products for CMOS semiconductor integrated circuits--Products of series 54/74 HC
GB/T 249-1989
The rule of type designation for discrete semiconductor devices