GB/T 47663-2026
蛋白质分子量测定 液相色谱-飞行时间质谱联用法
Determination of protein molecular weight—Liquid chromatography–time-of-flight mass spectrometry
- 实施日期
- 2026-11-01
- ICS 分类
- 71.040.40
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 47663-2026
Determination of protein molecular weight—Liquid chromatography–time-of-flight mass spectrometry
GB/T 6904-2026
Determination of pH in water for industrial recirculating cooling system and boiler
GB/T 21187-2026
Atomic absorption spectrophotometer
GB/T 21186-2026
Fourier transform infrared spectrometers
GB/T 47357-2026
Determination of melting point and drop melting point for Fischer-Tropsch synthesis wax—Differential scanning calorimetry
GB/T 47186-2026
Microbeam analysis—Quantitative analysis of rare earth minerals by electron probe microanalyzer
GB/T 47187-2026
Microbeam analysis—Volume electron microscopy—FIB-SEM imaging method for 3D-structure of biological samples
GB/T 629-2026
Chemical reagent—Sodium hydroxide
GB/T 631-2026
Chemical reagent—Ammonia solution
GB/T 602-2026
Chemical reagent—Preparations of standard solutions for impurity
GB/T 16493-2026
Chemical reagent—Trisodium citrate dihydrate
GB/T 18295-2026
Microbeam analysis—Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 47185-2026
Microbeam analysis—Analytical electron microscopy—Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
GB/T 47125-2026
General rules for photoelectric colorimetric analysis of continuous flow analysis
GB/T 47182-2026
Microbeam analysis—Analytical electron microscopy—Method for determining shell thickness of particles with core-shell structure
GB/Z 134-2026
Surface chemical analysis—Characterization of functional glass substrates for biosensing applications
GB/Z 129-2026
Surface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings
GB/T 47073-2026
Surface chemical analysis—Depth profiling—Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
GB/T 34326-2026
Surface chemical analysis—Depth profiling—Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
GB/T 47105-2026
Microbeam analysis—Standard file format for spectral-data exchange