组合使用关键词、标准类型、状态与 ICS 分类，快速定位所需国家标准。
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GB/T 47101-2026
Surface chemical analysis—Scanning probe microscopy—Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
GB/T 47065-2026
Surface chemical analysis—Surface characterization—Measurement of the lateral resolution of a confocal fluorescence microscope
GB/T 22461.3-2026
Surface chemical analysis—Vocabulary—Part 3: Terms used in optical interface analysis
GB/T 47076-2026
Surface chemical analysis—X-ray photoelectron spectroscopy—Measurement of binding energy for conductive carbon-based materials
GB/T 47026-2026
Performance measurement method for rapid nucleic acid detection instrument
GB/Z 37664.2-2025
Nanomanufacturing—Key control characteristics—Luminescent nanoparticles—Part 2:Determination of mass of quantum dot in dispersion
GB/Z 122-2025
Surface chemical analysis—Glow discharge mass spectrometry—Operating procedures
GB/T 15244-2013
GB/T 46133-2025
General rule for determination of nitrogen content by Dumas combustion method
GB/T 42125.6-2025
Safety requirements for electrical equipment for measurement, control, and laboratory use—Part 6: Particular requirements for equipment having testing or measuring circuits
GB/T 46057-2025
Microbeam analysis—Scanning electron microscopy—Method for evaluating critical dimensions by CD-SEM
GB/T 15617-2025
Microbeam analysis—Electron probe microanalysis—Quantitative analysis of silicate minerals
GB/T 17366-2025
Microbeam analysis—Electron probe microanalysis—Methods of specimen preparation for minerals and rocks
GB/T 20726-2025
Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
GB/T 46223-2025
Microbeam analysis—Analytical electron microscopy—Method for the determination of energy resolution for electron energy loss spectrum analysis
GB/T 19500-2025
Surface chemical analysis—General rules for X-ray photoelectron spectroscopic analysis method
GB/T 45768-2025
Surface chemical analysis—Secondary ion mass spectrometry—Linearity of intensity scale in single ion counting time-of-flight mass analysers
GB/T 20175-2025
Surface chemical analysis—Sputter depth profiling—Optimization using layered systems as reference materials
GB/T 42658.3-2025
Surface chemical analysis—Sample handling, preparation and mounting—Part 3: Biomaterials
GB/T 45770-2025
Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement