组合使用关键词、标准类型、状态与 ICS 分类，快速定位所需国家标准。
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GB/T 45770-2025
Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
GB/T 45773-2025
Surface chemical analysis—Near real-time information from the X-ray photoelectron spectroscopy survey scan—Rules for identification of, and correction for, surface contamination by carbon-containing compounds
GB/T 20176-2025
Surface chemical analysis—Secondary-ion mass spectrometry—Determination of boron atomic concentration in silicon using uniformly doped materials
GB/T 45772-2025
Surface chemical analysis—Electron spectroscopies—Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
GB/T 45769-2025
Surface chemical analysis—X-ray photoelectron spectroscopy—Estimating and reporting detection limits for elements in homogeneous materials
GB/T 32996-2025
Surface chemical analysis—Analysis of metal oxide films by glow discharge optical emission spectrometry
GB/T 45459-2025
Microbeam analysis—Focused ion beam—Preparation of TEM specimens
GB/T 45131-2025
Analysis of water used in boiler and cooling system—Determination of phosphate, chloride, silicate, total alkalinity, phenolphthalein alkalinity, hardness and iron—Spectrophotometric detection by discrete analysis systems
GB/T 25187-2024
Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
GB/T 42518-2023
GB/T 14420-2024
Analysis of water used in boiler and cooling system—Determination of chemical oxygen demand—Rapid method with potassium dichromate
GB/T 43966-2024
General rules for high performance liquid chromatography-quadrupole inductively coupled plasma-mass spectrometry
GB/T 43748-2024
Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips
GB/T 28893-2024
Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
GB/T 28892-2024
Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
GB/T 43663-2024
Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/T 43661-2024
Surface chemical analysis—Scanning probe microscopy—Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
GB/T 43664.1-2024
Determination of dispersing performance for water treatment chemicals—Part 1：Dispersing kaolin method
GB/T 19502-2023
Surface chemical analysis—General rules for glow discharge optical emission spectrometry (GD-OES)
GB/T 43098.2-2023
Analysis of water treatment chemicals—Part 2: Determination of arsenic, mercury, cadmium, chromium, lead, nickel and copper—Inductively coupled plasma mass spectrometry(ICP-MS)