GB/T 19289-2019
电工钢带(片)的电阻率、密度和叠装系数的测量方法
Methods of measurement of resistivity,density and stacking factor of electrical steel strip and sheet
- 实施日期
- 2020-05-01
- ICS 分类
- 77.040.99
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 19289-2019
Methods of measurement of resistivity,density and stacking factor of electrical steel strip and sheet
GB/T 16597-2019
Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods
GB/T 6525-2019
Determination of compression strength for sintered metal materials at room temperature
GB/T 224-2019
Determination of the depth of decarburization of steels
GB/T 37385-2019
Test method for chloride content of silicon—Ion chromatography method
GB/T 37306.2-2019
Metallic materials—Fatigue testing—Variable amplitude fatiguetesting—Part 2: Cycle counting and related data reduction methods
GB/T 37306.1-2019
Metallic materials—Fatigue testing—Variable amplitude fatigue testing—Part 1: General principles, test method and reporting requirements
GB/T 351-2019
Metallic materials—Resistivity measurement method
GB/T 4059-2018
Test method for phosphorus content in polycrystalline silicon by zone-melting method under controlled atmosphere
GB/T 37213-2018
Test method for silicon brick dimension—Laser technology method
GB/T 37211.2-2018
Methods for chemical analysis of germanium metal—Part 2:Determination of aluminium,iron,copper,nickle,lead,cadmium, magnesium,cobalt,indium,zinc content—Inductively coupled plasma mass spectrometry method
GB/T 37211.1-2018
Methods for chemical analysis of germanium metal—Part 1:Determination of arsenic content—Arsenic stain method
GB/T 37049-2018
Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method
GB/T 26068-2018
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method
GB/T 19921-2018
Test method for particles on polished silicon wafer surfaces
GB/T 1550-2018
Test methods for conductivity type of extrinsic semiconducting materials
GB/T 5677-2018
Castings—Radiographic testing
GB/T 4060-2018
Test method for boron content in polycrystalline silicon by vacuum zone-melting method
GB/T 36705-2018
Test method for carrier concentration of gallium nitride substrates—Raman spectrum method
GB/T 36611-2018
Mechanical properties measurement—Room temperature tensile test of Ag-and/or Ag alloy-sheathed Bi-2223 and Bi-2212 composite superconductors