GB/T 47760-2026
铸钢件相控阵超声检测方法
Phased-array ultrasonic testing method for steel castings
- 实施日期
- 2027-02-01
- ICS 分类
- 77.040.20
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 47760-2026
Phased-array ultrasonic testing method for steel castings
GB/T 6396-2026
Clad steel plates一Mechanical and technological test
GB/T 47876-2026
Non-destructive testing of steel pipes—Phased-array ultrasonic automatic testing method for weld seam of submerged arc-welded steel pipes
GB/T 43894.3-2026
Practice for determining semiconductor wafer near-edge geometry—Part 3:Sector area flatness(ESFQR,ESFQD,ESBIR)
GB/T 47914-2026
Method for ultrasonic testing of clad steel tubes
GB/T 2970-2026
Method for ultrasonic testing of thick steel plates
GB/T 47906-2026
Practice methods for nanotopography of 300 mm silicon wafer surface
GB/T 22315-2026
Metallic materials—Determination of modulus of elasticity and Poisson's ratio
GB/T 10128-2026
Metallic materials—Torsion test at ambient temperature
GB/T 47623-2026
Non-destructive testing of steel pipes—Automatic ultrasonic testing for weld seam imperfections of thick-wall welded steel pipes
GB/T 3246.2-2026
Inspection method for structure of wrought aluminium and aluminium alloy products—Part 2 : Inspection method for macrostructure
GB/T 32967-2026
Metallic materials—High strain rate torsion test at room temperature
GB/T 12443-2026
Metallic materials—Torque-controlled fatigue testing method
GB/T 2522-2026
Methods of measurement of the coating insulation resistance and coating adhesion of electrical steel strip and sheet
GB/T 20127.3-2026
Steel and alloy—Determination of trace element contents—Part 3: Determination of scandium and barium content by inductively coupled plasma atomic emission spectrometric method
GB/T 47089-2026
Test method for determining geometrical parameters of patterns on patterned sapphire substrate
GB/T 47080-2026
Test method for dislocation density of diamond single crystal polished wafer
GB/T 47081-2026
Determination of iron, aluminum and calcium of silicon nitride powder—Inductively coupled plasma atomic emission spectrometry
GB/T 43894.2-2026
Practice for determining semiconductor wafer near-edge geometry—Part 2: Roll-off amount(ROA)
GB/T 47082-2026
Test method for stacking faults of polished monocrystalline silicon carbide wafers