GB/T 42902-2023
碳化硅外延片表面缺陷的测试 激光散射法
Test method for surface defects on silicon carbide epitaxial wafers—Laser scattering method
- 实施日期
- 2024-03-01
- ICS 分类
- 77.040
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 42902-2023
Test method for surface defects on silicon carbide epitaxial wafers—Laser scattering method
GB/T 42905-2023
Test method for thickness of silicon carbide epitaxial layer—Infrared reflectance method
GB/T 42900-2023
Metallic materials—High strain rate compression test method at elevated temperature
GB/T 42907-2023
Test method for excess-charge-carrier recombination lifetime in silicon ingots, silicon bricks and silicon wafers—Noncontact eddy-current sensor
GB/T 22640-2023
Test method for determining susceptibility to stress corrosion cracking of aluminum alloys
GB/T 10561-2023
Determination of content of nonmetallic inclusions in steel—Micrographic method using standard diagrams
GB/T 8358-2023
Steel wire ropes—Determination of breaking force
GB/T 7998-2023
Method for evaluating the susceptibility to intergranular corrosion of aluminum alloys
GB/T 7233.2-2023
Steel castings—Ultrasonic testing—Part 2:Steel castings for highly stressed components
GB/T 28896-2023
Metallic materials—Method of test for the determination of quasistatic fracture toughness of welds
GB/T 7233.1-2023
Steel castings—Ultrasonic testing—Part 1:Steel castings for general purposes
GB/T 239.2-2023
Metallic materials—Wire—Part 2: Reverse torsion test
GB/T 239.1-2023
Metallic materials—Wire—Part1:Simple torsion test
GB/T 42400-2023
Hardness test methods on metal parts repaired by laser cladding
GB/T 42472-2023
Critical current measurement—Retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires
GB/T 41966-2022
Ultrasonic phased array testing method for seamless steel tubes
GB/T 37211.3-2022
Method for chemical analysis of metal germanium—Part 3: Determination of trace impurity elements content—Glow discharge mass spectrometry
GB/T 42274-2022
Determination of the content and distribution of trace elements (magnesium, gallium) in aluminum nitride materials—Secondary ion mass spectrometry
GB/T 42263-2022
Determination of nitrogen content in silicon single crystal—Secondary ion mass spectrometry method
GB/T 42276-2022
Determination of fluorine ion and chloride ion in silicon nitride powder—Ion chromatography method