GB/T 34374-2017
冲模 L形导板
Stamping dies—L-shaped guide plates
- 实施日期
- 2018-04-01
- ICS 分类
- 25.120.10
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 34374-2017
Stamping dies—L-shaped guide plates
GB/T 34372-2017
Walking tractor—Drawbar dimensions and power take-off types
GB/T 34371-2017
Risk assessment for amusement ride—General principles
GB/T 34370.6-2017
Nondestructive testing of amusement equipments—Part 6:Radiographic testing
GB/T 34370.5-2017
Nondestructive testing of amusement equipments—Part 5:Ultrasonic testing
GB/T 34370.4-2017
Nondestructive testing of amusement equipments—Part 4:Penetrant testing
GB/T 34370.3-2017
Nondestructive testing of amusement equipments—Part 3:Magnetic particle testing
GB/T 34370.2-2017
Nondestructive testing of amusement equipments-Part 2:Visual examination
GB/T 34370.1-2017
Nondestructive testing of amusement equipments—Part 1:General requirement
GB/T 34369-2017
General technical conditions for electrical control device of passenger ropeway
GB/T 34368-2017
Technical requirement for major maintenance of passenger ropeway
GB/T 34367-2017
Light conveyor belts—Determination of the relaxed elastic modulus
GB/T 34366-2017
Light conveyor belts—Determination of the electrostatic field generated by a running light conveyor belt
GB/T 34365-2017
Non-destructive testing—Terminology—Terms used in industrial computed tomography testing
GB/T 34363-2017
Non-destructive testing—Test method for fabricating and checking aluminum alloy ultrasonic standard reference blocks
GB/T 34362-2017
Non-destructive testing—Guide for eddy current testing using conformable sensor arrays
GB/T 34357-2017
Non-destructive testing—Terminology—Terms used in magnetic flux leakage testing
GB/T 34335-2017
General standard for management of scenic and historic areas
GB/T 34333-2017
Refractory products—Determination by inductively coupled plasma atomic emission spectrometry(ICP-AES)
GB/T 34326-2017
Surface chemical analysis—Depth profiling—Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS