GB/T 32189-2015
氮化镓单晶衬底表面粗糙度的原子力显微镜检验法
Test method for surface roughness of GaN single crystal substrate by atomic force microscope
- 实施日期
- 2016-11-01
- ICS 分类
- 77.040
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 32189-2015
Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB/T 32188-2015
The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
GB/T 32166.2-2015
Personal protective equipment—Eye and face protection—Occupational eye and face protectors—Part 2: Test methods
GB/T 5069-2015
Chemical analysis of magnesia-alumina refractories
GB/T 32287-2015
Methods of determination and calculation of heat balance for hot blast stove in blast furnace
GB/T 32283-2015
Test method for vapor attack on refractories for furnace superstructures
GB/T 32281-2015
Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry
GB/T 32280-2015
Test method for warp of silicon wafers—Automated non-contact scanning method
GB/T 32278-2015
Test methods for flatness of monocrystalline silicon carbide wafers
GB/T 32277-2015
Test method for instrumental neutron activation analysis (INAA) of silicon
GB/T 32266-2015
Method of performance testing for atomic fluorescence spectrometer
GB/T 32264-2015
Method of performance testing for gas chromatography-single quadrupole mass pectrometry
GB/T 32263-2015
Highly purified compound—Reagent for pesticide residue analysis—Method of the gas chromatography with electron capture detector(ECD)
GB/T 32262-2015
Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 32218-2015
Vacuum technology—Test methods for leak rates of vacuum system
GB/T 32216-2015
Hydraulic fluid power—Test method for the proportional/servo controlled hydraulic cylinder
GB/T 32178-2015
Refractory products and materials—Spectrometric determination of chromium (Ⅵ)in chrome refractories
GB/T 25753.4-2015
Vacuum technology—Roots vacuum pump— Measurement of performance characteristics—Part 4: Measurement of noise
GB/T 24578-2015
Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
GB/T 32213-2015
Information security technology—Public key infrastructure—Specifications for remote password authentication and key establishment