组合使用关键词、标准类型、状态与 ICS 分类，快速定位所需国家标准。
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GB/T 4937.37-2025
Semiconductor devices—Mechanical and climatic test methods—Part 37: Board level drop test method using an accelerometer
GB/T 46894-2025
EMC test generic specification of vehicle IC
GB/T 44937.3-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 3: Measurement of radiated emissions—Surface scan method
GB/T 44937.8-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 8: Measurement of radiated emissions—IC stripeline method
GB/T 44937.5-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 5: Measurement of conducted emissions—Workbench Faraday Cage method
GB/T 46809.1-2025
Semiconductor devices—Part 19-1: Smart sensors—Control scheme of smart sensors
GB/T 46822.2-2025
Fixed electric double-layer capacitors for use in electric and electronic equipment—Part 2: Sectional specification—Electric double-layer capacitors for power application
GB/T 44937.2-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 2: Measurement of radiated emissions—TEM cell and wideband TEM cell method
GB/T 44937.1-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 1: General conditions and definitions
GB/T 4937.8-2025
Semiconductor devices—Mechanical and climatic test methods—Part 8：Sealing
GB/T 6346.23-2025
Fixed capacitors for use in electronic equipment—Part 23:Sectional specification—Fixed metallized polyethylene naphthalate film dielectric surface mount DC capacitors
GB/T 30423-2025
High-voltage direct current (HVDC) installations—System tests
GB/T 15879.612-2025
Mechanical standardization of semiconductor devices—Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages—Design guidelines for fine-pitch land grid array (FLGA)
GB/T 4937.39-2025
Semiconductor devices—Mechanical and climatic test methods—Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
GB/T 3352-2025
Synthetic quartz crystal—Specifications and guidelines for use
GB/T 27700.2-2025
Surface acoustic wave (SAW) filters of assessed quality—Part 2: Guidelines for the use
GB/T 44807.2-2025
EMC IC modelling—Part 2: Models of integrated circuits for EMI behavioural simulation—Conducted emissions modelling (ICEM-CE)
GB/T 22319.8-2025
Measurement of quartz crystal unit parameters—Part 8: Test fixture for surface mounted quartz crystal units
GB/T 19405.4-2025
Surface mounting technology—Part 4: Classification, packaging, labelling and handling of moisture sensitive devices
GB/T 46821-2025
Test methods for device embedded substrate