GB/T 47753-2026
微机电系统(MEMS)技术 车规级MEMS半导体气体传感器技术规范
Micro-electro mechanical systems(MEMS)technology—Technical specification of automotive MEMS semiconductor gas sensor
- 实施日期
- 2027-02-01
- ICS 分类
- 31.200
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
找到 222 条
GB/T 47753-2026
Micro-electro mechanical systems(MEMS)technology—Technical specification of automotive MEMS semiconductor gas sensor
GB/T 47725-2026
Micro-electromechanical systems (MEMS) technology—Requirements for reliability evaluation of three-dimensional structure of through-silicon vias
GB/T 47719-2026
Micro-electromechanical systems (MEMS) technology—Test methods of the performances for MEMS capacitive microphone
GB/T 42709.3-2026
Semiconductor devices—Micro-electromechanical devices—Part 3: Thin film standard test piece for tensile testing
GB/T 42709.2-2026
Semiconductor devices—Micro-electromechanical devices—Part 2: Tensile testing method of thin film materials
GB/T 44937.6-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 6: Measurement of conducted emissions—Magnetic probe method
GB/T 46894-2025
EMC test generic specification of vehicle IC
GB/T 44937.3-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 3: Measurement of radiated emissions—Surface scan method
GB/T 44937.8-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 8: Measurement of radiated emissions—IC stripeline method
GB/T 44937.5-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 5: Measurement of conducted emissions—Workbench Faraday Cage method
GB/T 44937.2-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 2: Measurement of radiated emissions—TEM cell and wideband TEM cell method
GB/T 44937.1-2025
Integrated circuits—Measurement of electromagnetic emissions—Part 1: General conditions and definitions
GB/T 44807.2-2025
EMC IC modelling—Part 2: Models of integrated circuits for EMI behavioural simulation—Conducted emissions modelling (ICEM-CE)
GB/T 44807.3-2025
EMC IC modelling—Part 3: Models of integrated circuits for EMI behavioural simulation—Radiated emissions modelling (ICEM-RE)
GB/T 42968.9-2025
Integrated circuits—Measurement of electromagnetic immunity—Part 9: Measurement of radiated immunity—Surface scan method
GB/T 42968.3-2025
Integrated circuits—Measurement of electromagnetic immunity—Part 3: Bulk current injection (BCI) method
GB/T 42968.5-2025
Integrated circuits—Measurement of electromagnetic immunity—Part 5: Workbench Faraday cage method
GB/T 46280.5-2025
Specification for chiplet inerconnection interface—Part 5: Physical layer technical requirements based on 2.5D package
GB/T 46280.4-2025
Specification for chiplet inerconnection interface—Part 4: Physical layer technical requirements based on 2D package
GB/T 46280.3-2025
Specification for chiplet inerconnection interface—Part 3: Data link layer technical requirements