GB/T 33236-2016
多晶硅 痕量元素化学分析 辉光放电质谱法
Polycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method
- 实施日期
- 2017-11-01
- ICS 分类
- 71.040.40
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 33236-2016
Polycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method
GB/T 33090-2016
Chemical reagent—N-(1-naphthyl)ethylenediamine dihydrochloride
GB/T 33089-2016
Chemical reagent—N,N-dimethyl-p-phenylenediamine dihydrochloride
GB/T 33088-2016
Chemical reagent—Pararosaniline hydrochloride solution
GB/T 32999-2016
Surface chemical analysis—Depth profiling—Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
GB/T 32998-2016
Surface chemical analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction
GB/T 32997-2016
Surface chemical analysis—General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
GB/T 32996-2016
Surface chemical analysis—Analysis of metal oxide films by glow-discharge optical emission spectrometry
GB/T 33087-2016
Ultra pure water for instrumental analysis specification and test methods
GB/T 33086-2016
Water treatment chemical—Determination of arsenic and mercury—Atomic fluorescence spectrometry
GB/T 601-2016
Chemical reagent—Preparations of reference titration solutions
GB/T 32871-2016
Characterization of single-wall carbon nanotubes—Raman spectroscopy
GB/T 32704-2016
Safety requirements for laboratory instrument and equipment—Balance instrument
GB/T 32669-2016
Extinction spectra characterization of aggregate structure of gold nanorods
GB/T 32613-2016
Determination of chlorhydrocaobon contents in correction stationery—Gas chromatographic method
GB/T 32606-2016
Determination method of free formaldehyde in stationery goods—Spectrophotometry with acetylacetone
GB/Z 32490-2016
Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds
GB/Z 32494-2016
Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
GB/T 32565-2016
Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)
GB/T 32495-2016
Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon