GB/T 230.2-2022
金属材料 洛氏硬度试验 第2部分:硬度计及压头的检验与校准
Metallic materials—Rockwell hardness test—Part 2: Verification and calibration of testing machines and indenters
- 实施日期
- 2023-02-01
- ICS 分类
- 19.060;77.040.10
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
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GB/T 230.2-2022
Metallic materials—Rockwell hardness test—Part 2: Verification and calibration of testing machines and indenters
GB/T 2523-2022
Measuring method of surface roughness, peak count and waviness for cold-rolled metal sheet and strip
GB/T 13299-2022
Determination of free cementite, pearlite and Widmanstaten structure in steel
GB/T 17394.3-2022
Metallic materials—Leeb hardness test—Part 3: Calibration of reference test blocks
GB/T 17394.2-2022
Metallic materials—Leeb hardness test—Part 2: Verification and calibration of hardness testers
GB/T 230.3-2022
Metallic materials—Rockwell hardness test—Part 3:Calibration of reference blocks
GB/T 21838.3-2022
Metallic materials—Instrumented indentation test for hardness and materials parameters—Part 3:Calibration of reference blocks
GB/T 21838.2-2022
Metallic materials—Instrumented indentation test for hardness and materials parameters—Part 2: Verification and calibration of testing machines
GB/T 231.3-2022
Metallic materials—Brinell hardness test—Part 3:Calibration of reference blocks
GB/T 231.2-2022
Metallic materials—Brinell hardness test—Part 2: Verification and calibration of testing machines
GB/T 24174-2022
Steel—Determination of Bake-Hardening-Index (BH)
GB/T 41477-2022
Testing methods for mechanical properties of metal parts repaired by laser cladding
GB/T 4162-2022
Method for ultrasonic testing of forged and rolled steel bars
GB/T 22639-2022
Test method of exfoliation corrosion for aluminium alloy products
GB/T 18449.4-2022
Metallic materials—Knoop hardness test—Part 4: Tables of hardness values
GB/T 4340.4-2022
Metallic materials—Vickers hardness test—Part 4:Tables of hardness values
GB/T 32280-2022
Test method for warp and bow of silicon wafers—Automated non-contact scanning method
GB/T 17473.7-2022
Test methods of precious metals pastes used for microelectronics—Part 7: Determination of solderability and solder leaching resistance
GB/T 24581-2022
Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method
GB/T 13925-2010