GB 26572-2025
电器电子产品有害物质限制使用要求
Requirements for restricted use of hazardous substances in electrical and electronic products
- 实施日期
- 2027-08-01
- ICS 分类
- 31.020
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
找到 1,403 条
GB 26572-2025
Requirements for restricted use of hazardous substances in electrical and electronic products
GB/T 45908-2025
Sodium chloride optical components
GB/T 45714.54-2025
Printed circuit board materials—Part 5-4:Sectional specification set for conductive foils and films with or without coatings—Conductive pastes
GB/T 18501.8100-2025
Connectors for electrical and electronic equipment—Product requirements—Part 8-100: Power connectors—Detail specification for 2-pole or 3-pole power plus 2-pole signal shielded and sealed connectors with plastic housing for rated current of 20 A
GB/T 18501.8101-2025
Connectors for electrical and electronic equipment—Product requirements—Part 8-101: Power connectors—Detail specification for 2-pole or 3-pole power plus 2-pole signal shielded and sealed connectors with plastic housing for rated current of 40 A
GB/T 45660-2025
Electronics assembly technology—Electronic modules
GB/T 45716-2025
Semiconductor devices—Bias temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs)
GB/T 45720-2025
Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for gate dielectric films
GB/T 45722-2025
Semiconductor devices—Constant current electromigration test
GB/T 45719-2025
Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors
GB/T 45718-2025
Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers
GB/T 45721.1-2025
Semiconductor devices—Stress migration test—Part 1: Copper stress migration test
GB/T 45729-2025
Test methods for active ion concentration in laser material
GB/T 20871.62-2025
Organic light emitting diode displays—Part 6-2: Test methods—Visual quality and ambient performance
GB/T 45713.4-2025
Electronics assembly technology—Part 4: Endurance test methods for solder joint of area array type package surface mount devices
GB/T 33772.2-2025
Quality assessment systems —Part 2: Selection and use of sampling plans for inspection of electronic components and packages
GB/T 45723-2025
Test method for printed board—Monitoring of single plated-through hole(PTH) resistance change during temperature cycling
GB/T 21711.3-2025
Electromechanical elementary relays—Part 3: Relays with forcibly guided (mechanically linked) contacts
GB/T 21711.10-2025
Electromechanical elementary relays—Part 10: Additional functional aspects and safety requirements for high-capacity relays
GB/T 22452-2025
General specification of non-linear optical borate crystal devices