组合使用关键词、标准类型、状态与 ICS 分类，快速定位所需国家标准。
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GB/T 4937.31-2023
Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices（internally induced）
GB/T 42706.5-2023
Electronic components—Long-term storage of electronic semiconductor devices—Part 5：Die and wafer devices
GB/T 42750-2023
Measuring methods of optical radiation safety for wearable devices
GB/T 15879.604-2023
Mechanical standardization of semiconductor devices—Part 6-4: General rules for the preparation of outline drawings of surface mounted semiconductor device packages—Measuring methods for package dimensions of ball grid array (BGA)
GB/T 42706.2-2023
Electronic components—Long-term storage of electronic semiconductor devices—Part 2：Deterioration mechanisms
GB/T 42706.1-2023
Electronic components—Long-term storage of electronic semiconductor devices—Part 1：General
GB/T 42742-2023
Technical requirements for L band 75kW continuous wave magnetron
GB/T 42709.7-2023
Semiconductor devices—Micro-electromechanical devices—Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
GB/T 42709.5-2023
Semiconductor devices—Micro-electromechanical devices—Part 5: RF MEMS switches
GB/T 42576-2023
Technical requirements and testing methods of BDS/GNSS high precision system on chip (SoC)
GB/T 26111-2023
Micro-electromechanical system technology—Terms
GB/T 42191-2023
Test methods of the performances for MEMS piezoresistive pressure-sensitive device
GB/T 4937.23-2023
Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
GB/T 4937.42-2023
Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage
GB/T 42403-2023
Lasers and laser-related equipment—Test methods for the spectral characteristics of lasers
GB/T 42158-2023
Micro-electromechanical systems technology（MEMS） —Description and measurement methods for micro trench and pyramidal needle structures
GB/T 21711.1-2023
Electromechanical elementary relays—Part 1: General and safety requirements
GB/T 6346.14-2023
Fixed capacitors for use in electronic equipment—Part 14: Sectional specification—Fixed capacitors for electromagnetic interference suppression and connection to the supply mains
GB/T 42308-2023
Potentiometers for use in electronic equipment—Part 6-1:Blank detail specification—Surface mount preset potentiometers—Assessment level EZ
GB/T 42257-2022
Method for measuring optical and laser performance for Chromium and Erbium co-doped Yttrium Scandium Gallium Garnet laser crystal