GB/T 20296-2006
集成电路记忆法与符号
Mnemonics and symbols for integrated circuits
- 实施日期
- 2007-01-01
- ICS 分类
- 31.200
组合使用关键词、标准类型、状态与 ICS 分类,快速定位所需国家标准。
找到 222 条
GB/T 20296-2006
Mnemonics and symbols for integrated circuits
GB/T 19403.1-2003
Semiconductor devices--Integrated circuits--Part 11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)
GB/T 17574.10-2003
Semiconductor devices--Integrated circuits--Part 2-10:Digital integrated circuits--Blank detail specification for integrated circuit dynamicread/write memories
GB/T 19248-2003
Test method for measuring the resistance of package leads
GB/T 18500.2-2001
Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 2:Blank detail specification for linear analogue-to-digital converters(ADC)
GB/T 18500.1-2001
Semiconductor devices--Integrated circuits--Part 4:Interface integrated circuits--Section 1:Blank detail specification for linear digital-to-analogue converters(DAC)
GB/T 17940-2000
Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
GB/T 5965-2000
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section one--Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)
GB/T 17866-1999
Guideline for programmed defect masks and benchmark procedures for sensitivity analysisof mask defect inspection systems
GB/T 17865-1999
Specification for measuring depth of focus and best focus
GB/T 17864-1999
CD Metrology procedures
GB/T 17574-1998
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits
GB/T 17572-1998
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Four:Family specification for complementary MOS digital integrated circuits,series 4000B and 4000UB
GB/T 9424-1998
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section Five:Blank detail specification for complementary MOS digital inte-grated circuits,series 4000B and 4000UB
GB/T 17024-1997
Semiconductor devices--integratedcircuits--Part 2:Digital integrated circuits--Section three--Blank detail specification for HCMOS digital integrated circuits series 54/74HC,54/74HCT,54/74HCU
GB/T 17023-1997
Semiconductor devices--Integrated circuits--Part 2:Digital integrated circuits--Section two--Family specification for HCMOS digital integrated circuits series 54/74HC,54/74HCT,54/74HCU
GB/T 16878-1997
Specification for metrology pattern cells for integrated circuit manufacture
GB/T 16527-1996
Specification for photoresist/E-beam resist for hard surface photoplates
GB/T 16523-1996
Specification for round quartz photomask substrates
GB/T 16526-1996
Test method of measuring the lead-to-lead and loading capacitance of package leads